Patent Number: 7,102,362

Title: Integrated circuit for testing circuit components of a semiconductor chip

Abstract: An integrated circuit includes a first circuit component, a second circuit component, and an external terminal for making contact with the circuit. The first circuit component is connected to the external terminal via the second component. A bridging circuit connects the first circuit component to the external terminal and can be activated by a test mode signal. In the active state, the bridging circuit connects the external terminal to the first circuit component while bridging the second circuit component, while it is nonconducting in the deactivated state. Circuit components integrated in the semiconductor chip can be electrically measured nondestructively via activatable switches. Circuit components that lie between the external terminal and the device to be measured can be excluded from the measurement by bridging circuits. The method also makes it possible to measure a plurality of integrated devices in parallel or serially.

Inventors: Funfrock; Fabien (Munchen, DE), Sommer; Michael Bernhard (Raubling, DE)

Assignee: Infineon Technologies, AG

International Classification: G01R 27/06 (20060101); G01R 31/3185 (20060101); G11C 29/04 (20060101)

Expiration Date: 9/05/02018