Patent Number: 7,102,555

Title: Boundary-scan circuit used for analog and digital testing of an integrated circuit

Abstract: Method and apparatus are described for providing analog capability with boundary-scanning for an integrated circuit. The integrated circuit includes a boundary-scan controller (1517) coupled to an analog-to-digital converter (200). An analog channel is selected for input to the analog-to-digital converter (200). Analog information is converted to digital information by the analog-to-digital converter (200), and then such digital information may be stored in data registers (209) for reading out via the boundary-scan controller (1517).

Inventors: Collins; Anthony J. (Dublin, IE), Schultz; David P. (San Jose, CA), Jacobson; Neil G. (Los Altos, CA), McGettigan; Edward S. (San Jose, CA), Fross; Bradley K. (Claremont, CA)

Assignee: Xilinx, Inc.

International Classification: H03M 1/10 (20060101); G01R 31/28 (20060101)

Expiration Date: 9/05/02018