Patent Number: 7,102,672

Title: Integrated CMOS imaging array dark current monitor

Abstract: A method, apparatus, and system for accounting for dark current in the output of an imaging array is presented. A dark current monitor on the monolithic semiconductor imaging array is provided. The dark current monitor may be darkened pixels of the imaging array, darkened pixels of another array, or a temperature monitor and associated circuitry necessary to calculate relative dark current from the monitored temperature.

Inventors: Jacobs; Adam (Woodcliff Lake, NJ)

Assignee: Electro Optical Sciences INC

International Classification: H04N 5/217 (20060101)

Expiration Date: 9/05/02018