Patent Number: 7,102,754

Title: Measuring method and apparatus using attenuation in total internal reflection

Abstract: A state of attenuation in total internal reflection is detected by the use of a measuring apparatus having a measuring unit and a reference unit and a measuring system which corrects result of detection by the measuring unit on the basis of result of detection by the reference unit and measures the change of a state of attenuation in total internal reflection on the basis of the corrected result of detection by the measuring unit. The difference in sensitivity between the measuring unit and the reference unit is detected before initiating the measurement of the change of a state of attenuation in total internal reflection, and result of measurement by the measuring system is calibrated on the basis of the difference in sensitivity between the measuring unit and the reference unit.

Inventors: Ohtsuka; Hisashi (Kaisei-machi, JP), Shimizu; Hitoshi (Kaisei-machi, JP), Kimura; Toshihito (Kaisei-machi, JP)

Assignee: Fuji Photo Film Co., Ltd.

International Classification: G01N 21/55 (20060101)

Expiration Date: 9/05/02018