Patent Number: 7,132,840

Title: Method of electrical testing

Abstract: A method of electrical testing devices such as integrated circuits that include conductive pads formed on the surface. A material having a desired bulk resistivity and viscosity is applied to either the device or the electrical probe prior to testing. The application of the material has been found to substantially reduce the need for cleaning of the probe.

Inventors: Golden; James (Afton, MN), Rademacher; Wayne (Jordon, MN), Schumacher; Calvin Lee (Elko, MN), Seitzer; Philip William (Bethlehem, PA), Stang; Steven V. (Inver Grove Heights, MN)

Assignee: Agere Systems Inc

International Classification: G01R 31/02 (20060101); C23C 16/52 (20060101); C23C 20/00 (20060101)

Expiration Date: 2019-11-07 0:00:00