Patent Number: 7,133,102

Title: Liquid crystal display device and fabricating method thereof comprising monitoring an etch rate by measuring a thickness or resistance of one of the metal samples formed in a dummy area

Abstract: A liquid crystal display device and a fabricating method thereof enabling an optimized process by forming metal samples having various line widths on a circumference of a cell. The metal samples enable the measurement of a specific resistance of a data line formed by an ashing process. The specific resistance measurements are useful for designing the device. The invention includes a substrate divided into active and dummy areas, in which gate lines and data lines formed in the active area in directions perpendicular to each other. A plurality of metal samples are formed in the dummy area in which the metal samples have differing line widths in order to monitor the etch rate when forming the data line and the source/drain electrodes of the display device.

Inventors: Choi; Seung Kyu (Taegu-kwangyokshi, KR), Na; Du Hyun (Incheon-kwangyokshi, KR)

Assignee: LG. Philips LCD Co., Ltd.

International Classification: G02F 1/136 (20060101)

Expiration Date: 2019-11-07 0:00:00