Patent Number: 7,133,241

Title: Method and apparatus for optimizing record quality with varying track and linear density by allowing overlapping data tracks

Abstract: A method and apparatus for optimizing data record quality on a disk for a pair of read and write heads, in which the write head is bigger, by adaptively varying linear and track density of overlapping recorded tracks to achieve a target storage capacity. In the method, target storage capacity and radial writing direction are selected. Read and write widths of heads are determined. A linear density and offset distance pairing for optimizing record quality at target storage capacity is determined, wherein offset distance is less than write width but greater than read width. The write head writes a track at the linear density, is offset in the radial direction by the offset distance, and the offset distance is stored. The write head writes a new track at the linear density. Offsetting, storing offset, and writing a new track are repeated until desired data is written into a cluster.

Inventors: Che; Xiaodong (Saratoga, CA), Hsiao; Wen-Chien David (San Jose, CA), Luo; Yansheng (Fremont, CA), Sui; Xiaoyu (Fremont, CA), Yuan; Samuel Wei-san (Saratoga, CA)

Assignee: Hitachi Global Storage Technologies Netherlands B.V.

International Classification: G11B 21/02 (20060101)

Expiration Date: 2019-11-07 0:00:00