Patent Number:
7,280,942
Title:
Method for representing a combination of signals with a distribution of a single lognormal random variable
Abstract:
A method analyzes a set of signal acquired from a physical system. A set of parameters characterizing the set of signals is measured. The parameters can include the mean and the variance of the power of the signal, and a Rician factor. A first point and a second point of a moment generating function for a combination of the set of signals are evaluated according to the set of parameters to obtain a first sample and a second sample, respectively. First and second equations are defined. The equations respectively have an approximation of a moment generation function of a lognormal random variable representing the combination of the set of signals, at the first point and the second point, on the left side, and the first and second sample on the right side. The two equations are solved to obtain a mean and a variance of the lognormal random variable representing a distribution of the combination of the set of the signals.
Inventors:
Mehta; Neelesh B. (Medford, MA), Molisch; Andreas F. (Arlington, MA), Wu; Jingxian (Rohnert Park, CA), Zhang; Jinyun (Cambridge, MA)
Assignee:
Mitsubishi Electric Research Laboratories, Inc.
International Classification:
G06F 15/00 (20060101)
Expiration Date:
2019-10-09 0:00:00