Patent Number: 7,355,406

Title: Method and magnetic resonance imaging apparatus for planning an examination of a subject

Abstract: In a method for planning an examination of an examination subject in a magnetic resonance system, wherein images of different regions of the examination subject are acquired that are assembled into an overall image, the position of at least one first image in the examination subject, the measurement parameters for this at least one MR image are established, the position of at least one second image in the examination subject is determined, the measurement parameters for the at least one second image are established, and the measurement parameters that are dependent measurement parameters are determined. With these dependent measurement parameters the measurement parameters in the images are set (adjusted) such that they are identical for all images.

Inventors: Mayer; Klaus (Eckental, DE), Mohr; Cecile (Erlangen, DE), Muller; Mike (Mohrendorf, DE)

Assignee: Siemens Aktiengesellschaft

International Classification: G01V 3/00 (20060101)

Expiration Date: 2020-04-08 0:00:00