Patent Number: 7,355,414

Title: Test apparatus with low-reflection signal distribution

Abstract: A test apparatus includes a signal source that generates a radio-frequency test signal and is connected to the input connection of an arrangement. The arrangement simultaneously supplies an electrical radio-frequency signal to a plurality of receivers and via a plurality of distribution lines. Each distribution line includes an end with an output connection that applies the power-matched test signal to a respective external component.

Inventors: Arnold; Ralf (Poing, DE), Mattes; Heinz (Munchen, DE), Standner; Klaus (Villach, AT)

Assignee: Infineon Technologies, AG

International Classification: G01R 27/04 (20060101)

Expiration Date: 2020-04-08 0:00:00