Patent Number: 7,715,257

Title: Test method and semiconductor device

Abstract: A test method and a semiconductor device is disclosed. One embodiment provides sending out a test signal by a semiconductor device. A reflected signal generated in reaction is compared to the test signal with a first threshold value. The reflected signal is compared with a second threshold value differing from the first threshold value.

Inventors: Bucksch; Thorsten (Munich, DE)

Assignee: Qimonda AG

International Classification: G11C 7/00 (20060101)

Expiration Date: 5/11/12018