Patent Number: 7,716,152

Title: Use of sequential nearest neighbor clustering for instance selection in machine condition monitoring

Abstract: A method is provided for selecting a representative set of training data for training a statistical model in a machine condition monitoring system. The method reduces the time required to choose representative samples from a large data set by using a nearest-neighbor sequential clustering technique in combination with a kd-tree. A distance threshold is used to limit the geometric size the clusters. Each node of the kd-tree is assigned a representative sample from the training data, and similar samples are subsequently discarded.

Inventors: Balderer; Christian (Niederhasu, CH), Neubauer; Claus (Monmouth Junction, NJ), Yuan; Chao (Secaucus, NJ)

Assignee: Siemens Aktiengesellschaft

International Classification: G06N 5/00 (20060101)

Expiration Date: 5/11/12018