Patent Number: 7,788,557

Title: Baseboard testing interface and testing method thereof

Abstract: The present invention relates to a baseboard testing interface, which comprises: a baseboard, on which a plurality of first electronic components, a plurality of signal lines, and a first connection interface are configured, and the first electronic components are coupled to the signal lines; a slot disposed on the baseboard for an external interface adapter to plug in; and a debugging adapter that is plugged into the slot, and a plurality of second electronic components and a second connection interface are configured thereon; when the debugging adapter is plugged into the slot and fixed on the baseboard, the second connection interface is contacted with the first connection interface, such that the signals can be transmitted between the baseboard and the debugging adapter. In addition, the present invention further provides a baseboard testing method.

Inventors: Kuan-Ting; Chen (Taipei, TW), Ming-Sheng; Tsai (Taipei, TW), Shu-Hsuan; Teng (Taipei, TW), Kuo-Chun; Ling (Taipei, TW)

Assignee: Compal Electronics, Inc.

International Classification: G01R 31/28 (20060101); G11C 29/00 (20060101); G01R 31/26 (20060101)

Expiration Date: 8/31/12018