Patent Number: 7,820,972

Title: Method of evaluating skin conditions and method of estimating skin thickness

Abstract: Methods of determining at least one of the degree of skin damage caused by UV light and the degree of physiologically aging of the skin, and methods of estimating at least one of an epidermal skin thickness and a dermal skin thickness by analysis of the near infrared absorption spectrum of skin are disclosed. The near infrared absorption spectrum of skin are analyzed and the obtained analysis result is used for monitoring skin conditions and evaluating cosmetics.

Inventors: Miyamae; Yuta (Yokohama, JP), Yamakawa; Yumika (Yokohama, JP), Tsuchiya; Junko (Yokohama, JP), Kawabata; Marie (Yokohama, JP)

Assignee: Pola Chemical Industries Inc.

International Classification: A61B 5/00 (20060101)

Expiration Date: 2018-10-26 0:00:00