Patent Number: 7,820,994

Title: System to test electronic part and method of controlling the same

Abstract: Disclosed herein are a system to test an electronic part and a method of controlling the same, which are capable of automatically detecting a position of a socket according to a variation in a position of the socket to efficiently test the electronic part. The system to test an electronic part using a robot to automatically test the electronic part includes: a distance measuring unit measuring a distance between a socket mounted on a substrate to test the electronic part and a reference block to provide a reference position; a position measuring unit detecting positional information of the reference block; and a controller calculating positional information of the socket using the measured distance between the socket and the reference block on the basis of the detected positional information of the reference block and controlling the robot using the calculated positional information of the socket.

Inventors: Kim; Seono (Suwon-si, KR), Yong; Hyung Jung (Suwon-si, KR), Park; Chul Jun (Seoul, KR)

Assignee: Samsung Electronics Co., Ltd.

International Classification: G01N 21/86 (20060101); G01R 31/26 (20060101); H05K 1/00 (20060101)

Expiration Date: 2018-10-26 0:00:00