Patent Number: 7,822,261

Title: Board inspecting apparatus, its parameter setting method and parameter setting apparatus

Abstract: For each teaching image, a plurality of patterns of color pickup regions each include a first region for picking up a color of a first part and a second region for picking up a color of a second part are set, the color of each pixel in the first region and the color of each pixel in the second region are mapped as a target point and an exclusion point respectively, to a color space for each of the patterns of the color pickup regions, a degree in separation between a target point distribution and an exclusion point distribution in the color space is calculated for each of the patterns of the color pickup regions, a pattern of a color pickup region having a maximum degree in separation is selected, a color range which divides the color space and has the largest difference between the number of target points and the number of exclusion points in the selected pattern therein is found, and the found color range is set as a color condition used in a board inspecting process.

Inventors: Moriya; Toshihiro (Nara, JP), Wada; Hirotaka (Nara, JP), Onishi; Takako (Kyoto, JP), Shimizu; Atsushi (Yokohama, JP), Nakajima; Akira (Otsu, JP)

Assignee: OMRON Corporation

International Classification: G06K 9/00 (20060101)

Expiration Date: 2018-10-26 0:00:00