Patent Number:
7,823,096
Title:
Inductance analysis system and method and program therefor
Abstract:
System, method and program for inductance analysis for reducing time for analysis, to cope with increase in the system size, to achieve high accuracy in the analysis. Information on a power supply plane, in a state in which a beginning point of non-coupled current of return current accompanying a signal current is placed in the vicinity of a signal through-hole on the power supply plane, based on position information of said signal through-hole, is received. Potential distribution in the power supply plane is determined and output. The non-coupled inductance from the signal through-hole to the power supply through-hole in the power supply plane is evaluated. In the potential analysis, non-coupled inductance L from the signal through-hole to the power supply through-hole is represented by resistance R. The relationship that a voltage increment .DELTA.V is represented by the product of the non-coupled inductance L and the rate of time change of the current, .DELTA.V=L.DELTA.I/.DELTA.t, is replaced by the relationship that the voltage V is represented by the product of resistance R and non-coupled current I, V=R.times.I. Potential analysis is performed by analyzing two-dimensional heat diffusion in the power supply plane assuming that a heat source is placed at a beginning point of the non-coupled current.
Inventors:
Katagiri; Mitsuaki (Tokyo, JP), Iida; Takashi (Yokohama, JP), Shimizu; Hiroya (Ryugasaki, JP), Isa; Satoshi (Tokyo, JP)
Assignee:
Elpida Memory, Inc.
International Classification:
G06F 17/50 (20060101); H01L 23/52 (20060101)
Expiration Date:
2018-10-26 0:00:00