Patent Number: 7,825,676

Title: Contactor and test method using contactor

Abstract: A contact terminal formed of an electrically conductive material is arranged in each of a plurality of holed of a contactor substrate. An electrically conductive part is formed on an inner surface of each hole. The contact terminal has a first contact part that contacts a terminal of an electronic part and a second contact part that contacts the electrically conductive part in a middle portion. When the contact terminal bends by the first contact part being pressed, the second contact part contacts the electrically conductive part of the contactor substrate and an appropriate degree of contact pressure is obtained.

Inventors: Koizumi; Daisuke (Kawasaki, JP), Kohashi; Naohito (Kawasaki, JP), Tashiro; Kazuhiro (Kawasaki, JP), Kumatabara; Takumi (Kawasaki, JP)

Assignee: Fujitsu Semiconductor Limited

International Classification: G01R 31/02 (20060101)

Expiration Date: 2019-11-02 0:00:00