Patent Number: 7,826,998

Title: System and method for measuring the temperature of a device

Abstract: A method of measuring the temperature of device under test includes the steps of injecting a first current into an on-chip diode wherein a die containing the on-chip diode is under test. A second current is injected into the on-chip diode. A junction temperature is calculated based on the first current and the second current.

Inventors: Taheri; Babak (San Francisco, CA), Patil; Gopal (Sunnyvale, CA), Maheshwari; Sanjeev (San Jose, CA)

Assignee: Cypress Semiconductor Corporation

International Classification: G01K 7/00 (20060101)

Expiration Date: 2019-11-02 0:00:00