Patent Number: 7,914,362

Title: Method of evaluating the quality of a lapping plate

Abstract: Embodiments of the present invention pertain to a evaluating the quality of a lapping plate. In one embodiment, information that indicates the quality of a lapping plate is received while the lapping plate is being used to lap a slider, and the information is used to evaluate the quality of the lapping plate while the lapping plate is being used to lap the slider.

Inventors: Bunch; Richard Dale (San Jose, CA), Crawforth; Linden James (San Jose, CA), Padilla; Eduardo (Hayward, CA), Wu; Xiao Z. (San Jose, CA)

Assignee: Hitachi Global Storage Technologies, Netherlands B.V.

International Classification: B24B 51/00 (20060101)

Expiration Date: 2019-03-29 0:00:00