Patent Number: 8,576,169

Title: System and method for determining an attitude of a device undergoing dynamic acceleration

Abstract: A system and a method for determining an attitude of a device undergoing dynamic acceleration is presented. A first attitude measurement is calculated based on a magnetic field measurement received from a magnetometer of the device and a first acceleration measurement received from a first accelerometer of the device. A second attitude measurement is calculated based on the magnetic field measurement received from the magnetometer of the device and a second acceleration measurement received from a second accelerometer of the device. A correction factor is calculated based at least in part on a difference of the first attitude measurement and the second attitude measurement. The correction factor is then applied to the first attitude measurement to produce a corrected attitude measurement for the device.

Inventors: Shaw; Kevin A. (Millbrae, CA), Chen; Ian (Campbell, CA)

Assignee: Sensor Platforms, Inc.

International Classification: G06F 3/033 (20130101)

Expiration Date: 1/05/12017