Patent Number: 8,576,983

Title: X-ray detector for phase contrast imaging

Abstract: The invention relates to an X-ray detector (30) that comprises an array of sensitive elements (P.sub.i-1,b, P.sub.ia, P.sub.ib, P.sub.i+1,a, P.sub.i+1,b) and at least two analyzer gratings (G.sub.2a, G.sub.2b) disposed with different phase and/or periodicity in front of two different sensitive elements. Preferably, the sensitive elements are organized in macro-pixels (II.sub.i) of e.g. four adjacent sensitive elements, where analyzer gratings with mutually different phases are disposed in front said sensitive elements. The detector (30) can particularly be applied in an X-ray device (100) for generating phase contrast images because it allows to sample an intensity pattern (I) generated by such a device simultaneously at different positions.

Inventors: Baeumer; Christian (Hergenrath, BE), Engel; Klaus Juergen (Aachen, DE), Herrmann; Christoph (Aachen, DE)

Assignee: Koninklijke Philips N.V.

International Classification: G01N 23/04 (20060101)

Expiration Date: 1/05/12017