Patent Number: 8,576,988

Title: Distributed X-ray source and X-ray imaging system comprising the same

Abstract: A distributed X-ray source (3) and an imaging system (1) comprising such an X-ray source (3) are proposed. The X-ray source (3) comprises an electron beam source arrangement (19) and an anode arrangement (17). The electron beam source arrangement (19) is adapted to emit electron beams (24) towards at least two locally distinct focal spots (27) on the anode arrangement (17). Therein, the X-ray source is adapted for displacing the anode arrangement (17) with respect to the electron beam source arrangement (19). While the provision of a plurality of focal spots allows acquisition of projection images under different projection angles thereby allowing reconstruction of three-dimensional X-ray images e.g. in tomosynthesis application, a displacement motion of the anode arrangement (17) with respect to the electron beam source arrangement (19) may allow for distributed heat flux to the anode arrangement thereby possibly reducing cooling requirements.

Inventors: Lewalter; Astrid (Aachen, DE), Pietig; Rainer (Malsch, DE), Chrost; Wolfgang (Hamburg, DE)

Assignee: Koninklijke Philips N.V.

International Classification: H01J 35/08 (20060101); H01J 35/28 (20060101)

Expiration Date: 1/05/12017