Patent Number: 8,717,049

Title: System and method for testing computer under varying environmental conditions

Abstract: A system for testing a computer includes a single chip microcontroller (SCM), an environmental test chamber, and a control device connected to the SCM and the environmental test chamber. The SCM repeatedly switches the computer on and off and monitors the computer's response. The environmental test chamber accommodates the computer. The control device receives monitored data from the SCM and controls temperature and humidity in the environmental test chamber.

Inventors: Xie; Ling-Yu (Shenzhen, CN), Xie; Xing-Ping (Shenzhen, CN)

Assignee: Hong Fu Jin Precision Industry (ShenZhen) Co., Ltd.

International Classification: G01R 31/10 (20060101); G01K 7/00 (20060101)

Expiration Date: 5/06/12018