Patent Number: 8,717,052

Title: Testing fuse configurations in semiconductor devices

Abstract: Methods, systems, and apparatus for testing semiconductor devices. A semiconductor device includes one or more external terminals configured to receive fuse configuration data from an external source. The semiconductor device also includes a soft-blow circuit to generate a soft-blow signal based on the fuse configuration data, and a fuse circuit that includes a fuse and has first and second operational states corresponding to the fuse being intact and blown, respectively. The fuse circuit is configured to receive the soft-blow signal and to select its operational state to be the first or second operational state based on the received soft-blow signal.

Inventors: Ong; Adrian E. (Pleasanton, CA), Fuller; Paul (Ketchum, ID), Heel; Nick van (Eagle, ID), Thomann; Mark (Boise, ID)

Assignee: Rambus Inc.

International Classification: G01R 31/3187 (20060101)

Expiration Date: 5/06/12018