Patent Number: 8,718,228

Title: Phase grating used for X-ray phase imaging, imaging apparatus for X-ray phase contrast image using phase grating, and X-ray computed tomography system

Abstract: A phase grating used for X-ray phase imaging is provided, in which a pitch can be narrowed by using a diffraction grating with a low aspect ratio. A phase grating used for X-ray phase imaging, characterized in that the phase grating includes a first diffraction grating in which a first projection part whose thickness is formed so that an in-coming X-ray transmits with a phase .pi.-shifted, and a first aperture part with the same aperture width as a width of the first projection part are cyclically arranged, and a second diffraction grating in which a second projection part with the same width as a width of the first projection part, and a second aperture part with the same aperture width as the aperture width of the first aperture part are cyclically arranged, and the second diffraction grating is formed as displaced on the first diffraction grating.

Inventors: Nakamura; Takashi (Yokohama, JP), Imada; Aya (Tokyo, JP), Itoh; Hidenosuke (Tokyo, JP)

Assignee: Canon Kabushiki Kaisha

International Classification: G21K 1/00 (20060101)

Expiration Date: 5/06/12018