Patent Number: 8,791,813

Title: Monitoring system for testing apparatus

Abstract: A monitoring system includes a testing apparatus and a display control apparatus connected to the testing apparatus. The testing apparatus includes a plurality of testing locations and a collection module connected to the plurality of testing locations. Each of the plurality of testing locations receives a tested product, which is tested by the testing apparatus. The collection module collects testing states of the tested products. A display apparatus is connected to the display control apparatus. The display control apparatus controls the display apparatus to show a plurality of indicating blocks corresponding to the plurality of testing locations. The display apparatus is adapted to display the plurality of indicating blocks to match the plurality of testing locations. The display control apparatus controls each of the plurality of indicating blocks to show the testing state of the tested product in each the plurality of testing locations.

Inventors: Chen; Dong (Shenzhen, CN)

Assignee: Hong Fu Jin Precision Industry (ShenZhen) Co., Ltd.

International Classification: G08B 29/00 (20060101)

Expiration Date: 7/29/12018