Patent Number: 8,791,951

Title: Image synthesis apparatus and method supporting measured materials properties

Abstract: An image synthesis apparatus supporting measured materials properties includes an input unit for receiving from a user selected information on material information processing, sampling and rendering; a material information processing unit for converting measured material data into raw material data, performing material model fitting on the raw material data to generate material information and performing material mixing on the material information to generate mixed material information, wherein the model fitting and the material mixing is performed according to the selected information; and a sampling unit for sampling the raw material data to generate sampling information. The apparatus further includes a materials properties rendering unit for rendering scene information contained in the selected information, the mixed material information and the sampling information to generate surface material information; and an output unit for visualizing the material information and the surface material information.

Inventors: Lee; Joo-Haeng (Daejeon, KR), Kim; Sung-Soo (Daejeon, KR), Nam; Seung Woo (Daejeon, KR)

Assignee: Electronics and Telecommunications Research Institute

International Classification: G09G 5/00 (20060101)

Expiration Date: 7/29/12018