Patent Number: 8,792,835

Title: System and method for wirelessly testing integrated circuits

Abstract: A system and method for wirelessly testing integrated circuits provides a multiple layer interface to wirelessly test integrated circuits. A wireless testing structure for an integrated circuit comprises a wireless transceiver and a wireless test interface. The wireless transceiver is configured to receive test information from a tester and transmit test result information to the tester. The wireless test interface is configured to interface between the wireless transceiver and the integrated circuit. The wireless test interface comprises a media access controller and a test control block. The media access controller is configured to implement a media access control protocol for wireless communication. The test control block is configured to decode test information received from the tester, to trigger a test of the integrated circuit in response to the decoded test information, and to encode test result information that is generated by the integrated circuit in response to the test.

Inventors: Andreu; David (Montarnaud, FR), Cauvet; Philippe (Caen, FR), Flottes; Marie-Lise (St Georges d'orques, FR), Noun; Ziad (Baalbeck, LB), Bernard; Serge (St Georges d'orques, FR)

Assignee: Centre National de la Recherche Scientifique

International Classification: H04B 17/00 (20060101)

Expiration Date: 7/29/12018