Patent Number: 8,793,297

Title: Phase interpolator, semiconductor device and testing method thereof

Abstract: Two selected testing selectors output testing input signals of reverse phases from each other according to the first control signal. Two selectors corresponding to the two testing selectors output the testing input signals output from the two testing selectors according to the second control signal. Two mixers corresponding to the two selectors output an output signal in which weighting is added to the testing input signals output from the two selectors are compounded. A detection circuit outputs an error signal when the output signal output from the two mixers is larger than a threshold value.

Inventors: Ozeki; Yoshitomo (Kawasaki, JP)

Assignee: Fujitsu Limited

International Classification: G06F 17/17 (20060101)

Expiration Date: 7/29/12018