Patent Number: 8,793,545

Title: Apparatus and method for clock glitch detection during at-speed testing

Abstract: A method and apparatus for detecting clock glitches during at-speed testing of integrated circuits is disclosed. In one embodiment, an integrated circuit includes a scan chain having a number of scan elements coupled in a series configuration. Each of the scan elements is coupled to receive a clock signal that may be cycled during a test operation. A subset of the scan elements are arranged to form, along with other components, a counter. Test stimulus data shifted into the scan chain to perform a test may include an initial count value that is shifted into the scan elements of the counter. When the test is performed, the count value is updated responsive to cycling of the clock signal. The updated count value is shifted from the counter along with other test result data, and may be used to determine if the number of clock cycles received during the test.

Inventors: Ramaswami; Ravi K. (Cupertino, CA), Makar; Samy R. (Fremont, CA), Hoang; Anh T. (Fremont, CA)

Assignee: Apple Inc.

International Classification: G01R 31/28 (20060101)

Expiration Date: 7/29/12018