Patent Number: 8,817,559

Title: Semiconductor device and manufacturing method thereof

Abstract: Such a device is disclosed that includes: redundancy circuits for replacing defective memory cells included in a memory cell array; an electrical fuse circuit that stores addresses of the defective memory cells; a data determination circuit that generates a determination signal by determining whether test data read from the memory cell array is correct or incorrect; and an analysis circuit that supplies, in a first operation mode, the electrical fuse circuit with an address signal supplied when the determination signal is activated, and supplies, in a second operation mode, the electrical fuse circuit with an address signal supplied when a data mask signal supplied from outside is activated irrespective of the determination signal.

Inventors: Ide; Akira (Tokyo, JP), Furumi; Shinji (Kanagawa, JP)

Assignee: PS4 Luxco S.a.r.l.

International Classification: G11C 29/04 (20060101); H01L 21/02 (20060101)

Expiration Date: 8/26/12018