Patent Number: 8,823,538

Title: Electronic device and method for optimizing order of testing points of circuit boards

Abstract: In a method for optimizing an order in which certain points on a circuit board can be tested and evaluated, a coordinate system is established in a circuit diagram of a circuit board, and at least one locating point is preset. When an operator selects a signal path routing within the circuit diagram, the method can display the testing points in the selected signal path routing on a display device. After calculating the distance between each of the testing points and each of the at least one locating point, a group of distances is obtained. By comparing the distances, the minimum distance can be determined from the group of distances. The method further optimizes the order of the testing points according to the distance between each of the testing points and the locating point that consists of the minimum distance.

Inventors: Liang; Hsien-Chuan (New Taipei, TW), Li; Shen-Chun (New Taipei, TW), Hsu; Shou-Kuo (New Taipei, TW)

Assignee: Hon Hai Precision Industry Co., Ltd.

International Classification: G08B 21/00 (20060101)

Expiration Date: 9/02/12018