Patent Number: 8,823,949

Title: Measurement apparatus

Abstract: A measurement apparatus includes a pedestal, a supporting tray, a first movable base, a first measuring assembly, a second movable base, a second measuring assembly, a third movable base, a third measuring assembly, and a console. The supporting tray is rotationally fixed in the pedestal and can be rotated to position a workpiece at different angles to ensure that images of all portions and surfaces needing to be measured can be captured.

Inventors: Chang; Chih-Kuang (New Taipei, TW), Liu; Wen-Dong (Shenzhen, CN)

Assignee: Hong Fu Jin Precision Industry (ShenZhen) Co., Ltd.

International Classification: G01B 11/24 (20060101)

Expiration Date: 9/02/12018