Patent Number: 8,878,973

Title: Solid-state imaging device

Abstract: According to one embodiment, a pixel that outputs a photoelectrically-converted pixel signal, a column ADC circuit that converts the pixel signal output from the pixel into a digital value, a test-signal generating unit that generates a test signal with which the column ADC circuit is tested, and a switching circuit that switches between the pixel signal output from the pixel and the test signal generated in the test-signal generating unit to input to the column ADC circuit are included.

Inventors: Kawata; Hidenobu (Kanagawa, JP)

Assignee: Kabushiki Kaisha Toshiba

International Classification: H04N 3/14 (20060101); H04N 5/335 (20110101); H04N 5/217 (20110101)

Expiration Date: 2019-11-04 0:00:00